JPH01103982U - - Google Patents
Info
- Publication number
- JPH01103982U JPH01103982U JP20073387U JP20073387U JPH01103982U JP H01103982 U JPH01103982 U JP H01103982U JP 20073387 U JP20073387 U JP 20073387U JP 20073387 U JP20073387 U JP 20073387U JP H01103982 U JPH01103982 U JP H01103982U
- Authority
- JP
- Japan
- Prior art keywords
- recorded
- time
- recording
- zoom
- recording medium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20073387U JPH01103982U (en]) | 1987-12-28 | 1987-12-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20073387U JPH01103982U (en]) | 1987-12-28 | 1987-12-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01103982U true JPH01103982U (en]) | 1989-07-13 |
Family
ID=31491125
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20073387U Pending JPH01103982U (en]) | 1987-12-28 | 1987-12-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01103982U (en]) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6878206B2 (en) | 2001-07-16 | 2005-04-12 | Applied Materials, Inc. | Lid assembly for a processing system to facilitate sequential deposition techniques |
US6911391B2 (en) | 2002-01-26 | 2005-06-28 | Applied Materials, Inc. | Integration of titanium and titanium nitride layers |
US6951804B2 (en) | 2001-02-02 | 2005-10-04 | Applied Materials, Inc. | Formation of a tantalum-nitride layer |
US7033922B2 (en) | 2000-06-28 | 2006-04-25 | Applied Materials. Inc. | Method and system for controlling the presence of fluorine in refractory metal layers |
US7085616B2 (en) | 2001-07-27 | 2006-08-01 | Applied Materials, Inc. | Atomic layer deposition apparatus |
US7262133B2 (en) | 2003-01-07 | 2007-08-28 | Applied Materials, Inc. | Enhancement of copper line reliability using thin ALD tan film to cap the copper line |
US7405158B2 (en) | 2000-06-28 | 2008-07-29 | Applied Materials, Inc. | Methods for depositing tungsten layers employing atomic layer deposition techniques |
US7494908B2 (en) | 2001-09-26 | 2009-02-24 | Applied Materials, Inc. | Apparatus for integration of barrier layer and seed layer |
US7501343B2 (en) | 2000-06-27 | 2009-03-10 | Applied Materials, Inc. | Formation of boride barrier layers using chemisorption techniques |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5033726A (en]) * | 1973-06-06 | 1975-04-01 | ||
JPS5234616A (en) * | 1975-09-11 | 1977-03-16 | Sony Corp | Magnetic video recording reproduction equipment |
JPS60246185A (ja) * | 1984-05-21 | 1985-12-05 | Fuji Photo Film Co Ltd | 写真画像の映像信号記録装置 |
JPS61173589A (ja) * | 1985-01-28 | 1986-08-05 | Shinko Kaiun Kk | ビデオテ−プ録画方法およびその装置 |
-
1987
- 1987-12-28 JP JP20073387U patent/JPH01103982U/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5033726A (en]) * | 1973-06-06 | 1975-04-01 | ||
JPS5234616A (en) * | 1975-09-11 | 1977-03-16 | Sony Corp | Magnetic video recording reproduction equipment |
JPS60246185A (ja) * | 1984-05-21 | 1985-12-05 | Fuji Photo Film Co Ltd | 写真画像の映像信号記録装置 |
JPS61173589A (ja) * | 1985-01-28 | 1986-08-05 | Shinko Kaiun Kk | ビデオテ−プ録画方法およびその装置 |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7501343B2 (en) | 2000-06-27 | 2009-03-10 | Applied Materials, Inc. | Formation of boride barrier layers using chemisorption techniques |
US7033922B2 (en) | 2000-06-28 | 2006-04-25 | Applied Materials. Inc. | Method and system for controlling the presence of fluorine in refractory metal layers |
US7115494B2 (en) | 2000-06-28 | 2006-10-03 | Applied Materials, Inc. | Method and system for controlling the presence of fluorine in refractory metal layers |
US7405158B2 (en) | 2000-06-28 | 2008-07-29 | Applied Materials, Inc. | Methods for depositing tungsten layers employing atomic layer deposition techniques |
US6951804B2 (en) | 2001-02-02 | 2005-10-04 | Applied Materials, Inc. | Formation of a tantalum-nitride layer |
US6878206B2 (en) | 2001-07-16 | 2005-04-12 | Applied Materials, Inc. | Lid assembly for a processing system to facilitate sequential deposition techniques |
US7085616B2 (en) | 2001-07-27 | 2006-08-01 | Applied Materials, Inc. | Atomic layer deposition apparatus |
US7494908B2 (en) | 2001-09-26 | 2009-02-24 | Applied Materials, Inc. | Apparatus for integration of barrier layer and seed layer |
US6911391B2 (en) | 2002-01-26 | 2005-06-28 | Applied Materials, Inc. | Integration of titanium and titanium nitride layers |
US7262133B2 (en) | 2003-01-07 | 2007-08-28 | Applied Materials, Inc. | Enhancement of copper line reliability using thin ALD tan film to cap the copper line |
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